Register information Patent

DE file number : 10 2013 205 255.3 (Status: pending/in force, Query started: October 19, 2025)

Please note: This English version is a non-binding translation of the German register excerpt. Only the German version of the register excerpt is legally binding.

Master data
INIDCriterionFieldContent
Type of IP rightSARTPatent
StatusSTPending/in force
21DE file number DAKZ10 2013 205 255.3
54Designation/titleTIDigitaler Temperatursensor
51IPC main classICM
(ICMV)		 G01K 7/00 (2006.01)
51IPC secondary class(es)ICS
(ICSV)		 G01K 7/01 (2006.01)
22DE application dateDATMar 26, 2013
43Date of first publicationOTOct 2, 2014
Date of publication of grantPETNov 2, 2017
71/73Applicant/ownerINHInstitut für Mikroelektronik- und Mechatronik-Systeme gGmbH, 98693 Ilmenau, DE
72InventorINTan, Jun, 99099 Erfurt, DE
74RepresentativeVTRMeissner Bolte Patentanwälte Rechtsanwälte Partnerschaft mbB, 07545 Gera, DE
10Published DE documentsDEPNOriginal document: DE102013205255A1
Searchable text: DE102013205255A1
Original document: DE102013205255B4
Searchable text: DE102013205255B4
Address for service Meissner Bolte Patentanwälte Rechtsanwälte Partnerschaft mbB, 07545 Gera, DE
LicenceLIZWillingness to grant licences to anyone declared
Due dateFT
FG		Mar 31, 2026
Annual fee for the 14th year Patent fees
Patent division in charge 52
56CitationsCT EP000002270453A1 (EP 2 270 453 A1)
EP000002182335A2 (EP 2 182 335 A2)
56NPL citationsCTNPSHIH, Yi-Chun ; SHEN, Tueng ; OTIS, Brian P.: A 2.3 [mu] W wireless intraocular pressure/temperature monitor. In: IEEE Journal of Solid-State Circuits (J-SSC). 2011, Bd. 46, H. 11, S. 2592-2601. ISSN 0018-9200 (p); 1558-173X (e). DOI: 10.1109/JSSC.2011.2164134. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6019016 [abgerufen am 23.03.2017]. Bibliographieinformationen ermittelt über: http://ieeexplore.ieee.org/document/6019016/ [abgerufen am 23.03.2017].;
LAW, Man Kay ; BERMAK, Amine ; LUONG, Howard C.: A sub-[mu] W embedded CMOS temperature sensor for RFID food monitoring application. In: IEEE Journal of Solid-State Circuits (J-SSC). 2010, Bd. 45, H. 6, S. 1246-1255. ISSN 0018-9200 (p); 1558-173X (e). DOI: 10.1109/JSSC.2010.2047456. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5482527 [abgerufen am 23.03.2017]. Bibliographieinformationen ermittelt über: http://ieeexplore.ieee.org/document/5482527/ [abgerufen am 23.03.2017].;
CHEN, Poki [u.a.]: A time-domain SAR smart temperature sensor with curvature compensation and a 3 [sigma] inaccuracy of 0.4[deg.]C 0.6[deg.]C over a 0[deg.]C to 90[deg.]C range. In: IEEE Journal of Solid-State Circuits (J-SSC). 2010, Bd. 45, H. 3, S. 600-609. ISSN 0018-9200 (p); 1558-173X (e). DOI: 10.1109/JSSC.2010.2040658. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5419184 [abgerufen am 23.03.2017]. Bibliographieinformationen ermittelt über: http://ieeexplore.ieee.org/document/5419184/ [abgerufen am 23.03.2017].;
YIN, Jun [u.a.]: A system-on-chip EPC Gen-2 passive UHF RFID tag with embedded temperature sensor. In: IEEE Journal of Solid-State Circuits (J-SSC). 2010, Bd. 45, H. 11, S. 2404-2420. ISSN 0018-9200 (p); 1558-173X (e). DOI: 10.1109/JSSC.2010.2072631. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5593894 [abgerufen am 23.03.2017]. Bibliographieinformationen ermittelt über: http://ieeexplore.ieee.org/document/5593894/ [abgerufen am 23.03.2017].;
SOURI, Kamran ; MAKINWA, Kofi A. A.: A 0.12 mm<2> 7.4 [mu] W micropower temperature sensor with an inaccuracy of +-0.2[deg.]C (3[sigma]) from -30[deg.]C to 125[deg.]C. In: IEEE Journal of Solid-State Circuits (J-SSC). 2011, Bd. 46, H. 7, S. 1693 - 1700. ISSN 0018-9200 (p); 1558-173X (e). DOI: 10.1109/JSSC.2011.2144290. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5772034 [abgerufen am 23.03.2017]. Bibliographieinformationen ermittelt über: http://ieeexplore.ieee.org/document/5772034/ [abgerufen am 23.03.2017].;
LIN, Yu-Shiang ; SYLVESTER, Dennis ; BLAAUW, David: An ultra low power 1 V, 220 nW temperature sensor for passive wireless applications. In: Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE. 2008, S. 507-510. ISBN 978-1-4244-2018-6. DOI: 10.1109/CICC.2008.4672133. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=4672133 [abgerufen am 23.03.2017].;
WOO, Kyoungho [u.a.]: Dual-DLL-based CMOS all-digital temperature sensor for microprocessor thermal monitoring. In: Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International. 2009, S. 68 - 69 ; 69a. ISBN 978-1-4244-3458-9. DOI: 10.1109/ISSCC.2009.4977311. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=4977311 [abgerufen am 23.03.2017]. Bibliographieinformationen ermittelt über: http://ieeexplore.ieee.org/document/4977311/ [abgerufen am 23.03.2017].;
PERTIJS, M. A. P. ; MAKINWA, K. A. A. ; HUIJSING, J. H.: A CMOS smart temperature sensor with a 3 [sigma] inaccuracy of +-0.1[deg.]C from -55[deg.]C to 125[deg.]C. In: IEEE Journal of Solid-State Circuits (J-SSC). 2005, Bd. 40, H. 12, S. 2805-2815. ISSN 0018-9200 (p); 1558-173X (e). DOI: 10.1109/JSSC.2005.858476. URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1546255 [abgerufen am 23.03.2017]. Bibliographieinformationen ermittelt über: http://ieeexplore.ieee.org/document/1546255/ [abgerufen am 23.03.2017].
43Date of first publicationEVTOct 2, 2014
Number of official communications (office actions) 1
Number of responses 1
Date of the first transfer into DPMAregisterEREGTOct 2, 2014
Date of the (most recent) update in DPMAregisterREGTApr 8, 2025
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  • Apr 8, 2025
    • Due date: changed
  • Aug 14, 2024
    • St.36: changed (technical change)
  • Apr 6, 2024; Apr 8, 2023; Apr 8, 2022; Apr 13, 2021; Apr 9, 2020; Apr 9, 2019; Oct 11, 2018; Sep 1, 2018; Apr 11, 2018; Nov 2, 2017; Jul 19, 2017; Jul 18, 2017; Jul 15, 2017; Apr 11, 2017; Mar 29, 2017; Mar 28, 2017; Jul 15, 2016; Apr 9, 2016; Jan 28, 2016; Dec 18, 2015; Apr 16, 2015
    • Historical data not available for this/these date(s)
  • Oct 2, 2014
    • Date of the first transfer into DPMAregister
Procedural data
No.Kind of procedureLegal statusDate of legal/procedural statusPublication dateAlle Details anzeigen
1 Pre-registration procedure The application is under preliminary examination Mar 26, 2013  Details anzeigen
2 Pre-registration procedure Pre-registration procedure has been concluded Jun 12, 2013  Details anzeigen
3 Examination procedure Request for examination effectively filed Mar 6, 2014  Details anzeigen
4 Publications Publication of application (Offenlegungsschrift) Oct 2, 2014 Oct 2, 2014 Details anzeigen
5 Licence Willingness to grant licences declared Dec 14, 2015 Jan 28, 2016 Details anzeigen
6 Examination procedure Official communication on examination Mar 28, 2017  Details anzeigen
7 Examination procedure Reply to official communication Jul 13, 2017  Details anzeigen
8 Examination procedure Decision to grant patent by Examining Section/Patent Division Jul 18, 2017  Details anzeigen
9 Publications Patent specification Nov 2, 2017 Nov 2, 2017 Details anzeigen
10 Examination procedure Grant of patent has become final Aug 3, 2018 Oct 11, 2018 Details anzeigen
View procedures Pre-registration procedure (No.: 1)
INIDCriterionFieldContent Close details
Type of procedureVARTPre-registration procedure
Legal/procedural statusVSTThe application is under preliminary examination
Date of legal/procedural statusVSTTMar 26, 2013
View procedures Pre-registration procedure (No.: 2)
INIDCriterionFieldContent Close details
Type of procedureVARTPre-registration procedure
Legal/procedural statusVSTPre-registration procedure has been concluded
Date of legal/procedural statusVSTTJun 12, 2013
View procedures Examination procedure (No.: 3)
INIDCriterionFieldContent Close details
Type of procedureVARTExamination procedure
Legal/procedural statusVSTRequest for examination effectively filed
Date of legal/procedural statusVSTTMar 6, 2014
Third party request No
Date of receiptAEGTMar 6, 2014
View procedures Publications (No.: 4)
INIDCriterionFieldContent Close details
Type of procedureVARTPublications
Legal/procedural statusVSTPublication of application (Offenlegungsschrift)
Date of legal/procedural statusVSTTOct 2, 2014
Issue numberHN40
YearPJ2014
Publication dateVTOct 2, 2014
Type of publicationPARTDocuments
PartHTPart 2
10Published DE documentsDEPNOriginal document: DE102013205255A1
Searchable text: DE102013205255A1
View procedures Licence (No.: 5)
INIDCriterionFieldContent Close details
Type of procedureVARTLicence
Legal/procedural statusVSTWillingness to grant licences declared
Date of legal/procedural statusVSTTDec 14, 2015
Issue numberHN4
YearPJ2016
Publication dateVTJan 28, 2016
Type of publicationPARTBibliographic data
PartHTPart 2
View procedures Examination procedure (No.: 6)
INIDCriterionFieldContent Close details
Type of procedureVARTExamination procedure
Legal/procedural statusVSTOfficial communication on examination
Date of legal/procedural statusVSTTMar 28, 2017
View procedures Examination procedure (No.: 7)
INIDCriterionFieldContent Close details
Type of procedureVARTExamination procedure
Legal/procedural statusVSTReply to official communication
Date of legal/procedural statusVSTTJul 13, 2017
View procedures Examination procedure (No.: 8)
INIDCriterionFieldContent Close details
Type of procedureVARTExamination procedure
Legal/procedural statusVSTDecision to grant patent by Examining Section/Patent Division
Date of legal/procedural statusVSTTJul 18, 2017
View procedures Publications (No.: 9)
INIDCriterionFieldContent Close details
Type of procedureVARTPublications
Legal/procedural statusVSTPatent specification
Date of legal/procedural statusVSTTNov 2, 2017
Issue numberHN44
YearPJ2017
Publication dateVTNov 2, 2017
Type of publicationPARTDocuments
PartHTPart 3
10Published DE documentsDEPNOriginal document: DE102013205255B4
Searchable text: DE102013205255B4
View procedures Examination procedure (No.: 10)
INIDCriterionFieldContent Close details
Type of procedureVARTExamination procedure
Legal/procedural statusVSTGrant of patent has become final
Date of legal/procedural statusVSTTAug 3, 2018
Issue numberHN41
YearPJ2018
Publication dateVTOct 11, 2018
Type of publicationPARTBibliographic data
PartHTPart 3